Enhancement of Sputtering Yields Due to C60 versus Ga Bombardment of Ag{111} As Explored by Molecular Dynamics Simulations-Reference-Cited by-同舟云学术

Enhancement of Sputtering Yields Due to C60 versus Ga Bombardment of Ag{111} As Explored by Molecular Dynamics Simulations

Published:2003-07-12 Issue:17 Volume:75 Page:4402-4407
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Postawa Zbigniew¹,Czerwinski Bartlomiej¹,Szewczyk Marek¹,Smiley Edward J.¹,Winograd Nicholas¹,Garrison Barbara J.¹

Affiliation:

1. Smoluchowski Institute of Physics, Jagiellonian University, Krakow, Poland, and 152 Davey Laboratory, Department of Chemistry, and 184 Materials Research Institute, The Pennsylvania State University, University Park, Pennsylvania 16802

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac034387a

Reference44 articles.

1. View from the edge

2. Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organics

3. Secondary-ion yields from surfaces bombarded with keV molecular and cluster ions

4. A Comparison of Desorption Yields from C+60 to Atomic and Polyatomic Projectiles at keV Energies

5. Cluster ion bombardment on atomically flat Au(111) solid surfaces

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