Atomic-Level Characterization of Dynamics of Copper Ions in CuAgSe-Reference-Cited by-同舟云学术

Atomic-Level Characterization of Dynamics of Copper Ions in CuAgSe

Published:2016-02-05 Issue:6 Volume:120 Page:3229-3234
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Shi Chenglong¹,Xi Xuekui¹,Hou Zhipeng¹,Liu Enke¹,Wang Wenhong¹,Jin Shifeng²,Wu Yue³,Wu Guangheng¹

Affiliation:

1. State Key Laboratory for Magnetism, Beijing National Laboratory for Condensed Matter Physics Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

2. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

3. Department of Physics and Astronomy, University of North Carolina, Chapel Hill 27599, United States

Funder

National Natural Science Foundation of China

Chinese Academy of Sciences

Beijing Municipal Science and Technology Commission

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.5b12296

Reference47 articles.

1. Ultrahigh Thermoelectric Performance by Electron and Phonon Critical Scattering in Cu2Se1-xIx

2. The missing memristor found

3. Conductance switching in Ag2S devices fabricated byin situsulfurization

4. Temperature Dependent Reversible p–n–p Type Conduction Switching with Colossal Change in Thermopower of Semiconducting AgCuS

5. Ionic diffusion within the α*and β phases of Ag3SI

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