Quantitative Analysis of Trap-State-Mediated Exciton Transport in Perovskite-Shelled PbS Quantum Dot Thin Films Using Photocarrier Diffusion-Wave Nondestructive Evaluation and Imaging-Reference-Cited by-同舟云学术

Quantitative Analysis of Trap-State-Mediated Exciton Transport in Perovskite-Shelled PbS Quantum Dot Thin Films Using Photocarrier Diffusion-Wave Nondestructive Evaluation and Imaging

Published:2016-06-27 Issue:26 Volume:120 Page:14416-14427
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Hu Lilei¹,Yang Zhenyu²,Mandelis Andreas¹²,Melnikov Alexander¹,Lan Xinzheng²,Walters Grant²,Hoogland Sjoerd²,Sargent Edward H.²

Affiliation:

1. Center for Advanced Diffusion-Wave and Photoacoustic Technologies (CADIPT), Department of Mechanical and Industrial Engineering, University of Toronto, Toronto, Ontario M5S 3G8, Canada

2. Edward S. Rogers Sr. Department of Electrical and Computer Engineering, University of Toronto, Toronto, Ontario M5S 3G4, Canada

Funder

Canada Research Chairs

Natural Sciences and Engineering Research Council of Canada

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.6b04468

Reference75 articles.

1. Materials interface engineering for solution-processed photovoltaics