High-Resolution Optical Line Width Measurements as a Material Characterization Tool
Author:
Affiliation:
1. PSL Research University, Chimie ParisTech, CNRS, Institut de Recherche de Chimie Paris, 11 rue Pierre et Marie Curie, 75005 Paris, France
2. World Laboratory, Mutsuno, Atsuta-ku, Nagoya 456-0023, Japan
Funder
Agence Nationale de la Recherche
Deutsche Forschungsgemeinschaft
Conseil Régional, Île-de-France
Publisher
American Chemical Society (ACS)
Subject
Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.6b03337
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1. Recent Developments in the Field of Inorganic Phosphors
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3. Sub-kilohertz optical linewidths of the 7F0 ↔ 5D0 transition in Y2O3:Eu3+
4. High-resolution laser spectroscopy of rare-earth doped insulators: a personal perspective
5. Effects of magnetic field orientation on optical decoherence inEr3+:Y2SiO5
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