Toward an Improved Method for Determining the Hamaker Constant of Solid Materials Using Atomic Force Microscopy. III: Experimental Validation of a New Approach-to-Contact Method
Author:
Affiliation:
1. Davidson School of Chemical Engineering, Purdue University, 480 Stadium Mall Drive, West Lafayette, Indiana 47907-2100, United States
Funder
American Chemical Society Petroleum Research Fund
Publisher
American Chemical Society (ACS)
Subject
Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.3c01623
Reference23 articles.
1. Particle adhesion theory and experiment
2. Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substrate
3. A method to quantitatively evaluate the Hamaker constant using the jump-into-contact effect in atomic force microscopy
4. The Jump-to-Contact Distance in Atomic Force Microscopy Measurement
5. A New “Quasi-Dynamic” Method for Determining the Hamaker Constant of Solids Using an Atomic Force Microscope
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