Study of Punctual Defects in Monolayer WS<sub>2</sub>: Evidence of Correlations Between Raman and Photoluminescence Spectroscopy-Reference-Cited by-同舟云学术

Study of Punctual Defects in Monolayer WS₂: Evidence of Correlations Between Raman and Photoluminescence Spectroscopy

Published:2024-04-19 Issue:17 Volume:128 Page:7294-7305
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Ildefonso Letícia Mara Vieira¹^ORCID,Buthers Erika Lira²^ORCID,Archanjo Bráulio Soares²^ORCID,Legnani Cristiano¹^ORCID,Quirino Welber Gianini¹^ORCID,Massote Daniel Vasconcelos Pazzini¹^ORCID,Maciel Indhira Oliveira¹^ORCID,Fragneaud Benjamin¹^ORCID

Affiliation:

1. Group of Nanoscience and Nanotechnology, Physics Department, Federal University of Juiz de Fora (UFJF), Juiz de Fora, Minas Gerais 36036-900, Brazil

2. Materials Metrology Division, National Institute of Metrology, Quality, and Technology (INMETRO), Duque de Caxias, Rio de Janeiro 25250-020, Brazil

Funder

Funda??o de Amparo ? Pesquisa do Estado de Minas Gerais

Conselho Nacional de Desenvolvimento Cient?fico e Tecnol?gico

Financiadora de Estudos e Projetos

Funda??o Carlos Chagas Filho de Amparo ? Pesquisa do Estado do Rio de Janeiro

Coordena??o de Aperfei?oamento de Pessoal de N?vel Superior

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.4c00511

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