Bulk-Sensitive Soft X-ray Edge Probing for Elucidation of Charge Compensation in Battery Electrodes-Reference-Cited by-同舟云学术

Bulk-Sensitive Soft X-ray Edge Probing for Elucidation of Charge Compensation in Battery Electrodes

Author:

Fehse Marcus¹²³^ORCID,Sahle Christoph J.⁴^ORCID,Hogan Matteo P.⁵,Cavallari Chiara⁴,Kelder Erik M.²³,Alfredsson Maria³⁵,Longo Alessandro¹⁶

Affiliation:

1. Dutch-Belgian (DUBBLE), ESRF - The European Synchrotron, CS 40220, 38043 Grenoble Cedex 9, France

2. Faculty of Applied Sciences, Delft University of Technology, PO Box 5, 2600 AA Delft, The Netherlands

3. Alistore European Research Institute, Université de Picardie Jules Verne, 33 rue Saint Leu, 80039 Amiens Cedex, France

4. ESRF - The European Synchrotron, CS 40220, 38043 Grenoble Cedex 9, France

5. School of Physical Sciences, University of Kent, Canterbury CT2 7NH, U.K.

6. Istituto per lo Studio dei Materiali Nanostrutturatti (ISMN)-CNR, UOS Palermo, Via Ugo La Malfa, 153, 90146 Palermo, Italy

Funder

Alistore-European Research Institute

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

Reference47 articles.

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