Understanding Nanocrystals’ Dopant Edge X-ray Absorption Fine Structure (XAFS) Spectra: An Iterative Fitting Model-Reference-Cited by-同舟云学术

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Understanding Nanocrystals’ Dopant Edge X-ray Absorption Fine Structure (XAFS) Spectra: An Iterative Fitting Model

Published:2023-09-11 Issue:37 Volume:127 Page:18518-18525
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Chakraborty Saptarshi¹^ORCID,Makkar Mahima¹^ORCID,Viswanatha Ranjani¹²³^ORCID

Affiliation:

1. New Chemistry Unit, Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore 560064, India

2. International Centre for Materials Science, Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore 560064, India

3. School of Advanced Materials, Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore 560064, India

Funder

Science and Engineering Research Board

Jawaharlal Nehru Centre for Advanced Scientific Research

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.3c04078

Reference33 articles.

1. Vibrational properties of Ge nanocrystals determined by EXAFS

2. Studies of cation dopant sites in metal oxides by EXAFS and computer-simulation techniques

3. X-ray-absorption studies of zirconia polymorphs. II. Effect ofY2O3dopant onZrO2structure

4. XAFS studies of ytterbium doped lead-telluride

5. X-ray Absorption Spectroscopy Study of La1–ySryCo1–xNbxO3

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