Silver Diffusion in Organic Optoelectronic Devices: Deposition-Related Processes versus Secondary Ion Mass Spectrometry Analysis Artifacts-Reference-Cited by-同舟云学术

Silver Diffusion in Organic Optoelectronic Devices: Deposition-Related Processes versus Secondary Ion Mass Spectrometry Analysis Artifacts

Published:2015-10-05 Issue:41 Volume:119 Page:23334-23341
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Philipp Patrick¹,Ngo Khanh Q.¹,Kieffer John²,Wirtz Tom¹

Affiliation:

1. Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg

2. Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136, United States

Funder

Fonds National de la Recherche Luxembourg

Division of Materials Research

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.5b06860

Reference45 articles.

1. Stability and Degradation of Organic and Polymer Solar Cells

2. Morphology control and material mixing by high-temperature organic vapor-phase deposition and its application to thin-film solar cells

3. Effects of substrate temperature on the film characteristics and gas-sensing properties of copper phthalocyanine films

4. Degradation mechanisms in organic photovoltaic devices

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