Theoretical Study of Cu Intercalation through a Defect in Zero-Layer Graphene on SiC Surface
Author:
Affiliation:
1. Department of Electronics Engineering and Computer Science, Fukuoka University, Fukuoka 814-0180, Japan
2. Japan Science and Technology Agency, CREST, 4-1-8 Hon-chou, Kawaguchi, Saitama 332-0012, Japan
Funder
Core Research for Evolutional Science and Technology
Japan Society for the Promotion of Science
Publisher
American Chemical Society (ACS)
Subject
Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.7b00314
Reference41 articles.
1. Electric Field Effect in Atomically Thin Carbon Films
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