Shell Thickness Dependence of the Plasmon-Induced Hot-Electron Injection Process in Au@CdS Core–Shell Nanocrystals-Reference-Cited by-同舟云学术

Shell Thickness Dependence of the Plasmon-Induced Hot-Electron Injection Process in Au@CdS Core–Shell Nanocrystals

Published:2021-09-02 Issue:36 Volume:125 Page:19906-19913
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Dong Huifang¹²,Feng Jingwen³,Liu Jia³,Wan Xiaodong³,Zhang Jiatao³^ORCID,Wang Zhuan¹,Chen Hailong¹⁴^ORCID,Weng Yu-Xiang¹²^ORCID

Affiliation:

1. The Laboratory of Soft Matter Physics, Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China

2. University of Chinese Academy of Sciences, Beijing 100190, China

3. Beijing Key Laboratory of Construction Tailorable Advanced Functional Materials and Green Applications, School of Materials Science and Engineering, Beijing Institute of Technology, Beijing 100081, China

4. Songshan Lake Materials Laboratory, Dongguan, Guangdong 523808, China

Funder

Ministry of Science and Technology of the People's Republic of China

National Natural Science Foundation of China

Chinese Academy of Sciences

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.1c05900

Reference67 articles.