Ionic-Liquid-Originated Carrier Trapping Dynamics at the Interface in Electric Double-Layer Organic FET Revealed by Operando Interfacial Analyses-Reference-Cited by-同舟云学术

Ionic-Liquid-Originated Carrier Trapping Dynamics at the Interface in Electric Double-Layer Organic FET Revealed by Operando Interfacial Analyses

Published:2020-01-03 Issue:4 Volume:124 Page:2543-2552
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Okaue Daijiro¹^ORCID,Tanabe Ichiro¹^ORCID,Ono Sakurako¹,Sakamoto Kota¹,Sato Taiki¹,Imanishi Akihito¹,Morikawa Yoshitada²³^ORCID,Takeya Jun⁴,Fukui Ken-ichi¹⁵^ORCID

Affiliation:

1. Department of Materials Engineering Science, Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531, Japan

2. Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan

3. Research Centre for Ultra-Precision Science and Technology, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan

4. Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa, Chiba 277-8561, Japan

5. Institute for Molecular Science (IMS), Okazaki 444-8585, Japan

Funder

Japan Society for the Promotion of Science

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.9b10636

Reference64 articles.

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