Monitoring Deformation in Graphene Through Hyperspectral Synchrotron Spectroscopy to Inform Fabrication

Author:

Winter Allen Douglas1,Rojas Wudmir Y.1,Williams Adrienne D.2,Kim Steve S.2,Ouchen Fahima2,Fischer Daniel A.3,Weiland Conan4,Principe Edward4,Banerjee Sarbajit5ORCID,Huynh Chuong6,Naik Rajesh R.2ORCID,Liu Yijin7ORCID,Mehta Apurva7ORCID,Grote James2,Prendergast David8,Campo Eva M.19ORCID

Affiliation:

1. School of Electronic Engineering, Bangor University, Bangor, LL571UT, U.K.

2. Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson AFB, Fairborn, Ohio 45433, United States

3. National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States

4. Synchrotron Research Inc., Melbourne, Florida 32901, United States

5. Department of Chemistry, Texas A&M University, College Station, Texas 77840, United States

6. Carl Zeiss Microscopy, LLC, One Corporation Way, Peabody, Massachusetts 01960, United States

7. Stanford Synchrotron Radiation Laboratory, Stanford University, SLAC, Stanford, California 94309, United States

8. Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States

9. Department of Physics and Astronomy, University of Texas at San Antonio, San Antonio, Texas 78249, United States

Funder

Basic Energy Sciences

Air Force Office of Scientific Research

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

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