Raman Mapping as a Tool for Evaluating I2 and I3– Diffusion Over Single-Crystal UiO-67_NH2(M) (M = Zr, Zr/Hf, or Hf)-Reference-Cited by-同舟云学术

Raman Mapping as a Tool for Evaluating I₂ and I₃^– Diffusion Over Single-Crystal UiO-67_NH₂(M) (M = Zr, Zr/Hf, or Hf)

Published:2023-02-28 Issue:9 Volume:127 Page:4618-4635
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Andrade Pedro H. M.¹^ORCID,Moreau Myriam¹,Henry Natacha²,Bakouche Mohamed T.²,Duval Sylvain²^ORCID,Volkringer Christophe²^ORCID,Loiseau Thierry²^ORCID,Hureau Matthieu¹,Moissette Alain¹^ORCID

Affiliation:

1. Laboratoire de Spectroscopie pour les Interactions, la Réactivité et l’Environnement (LASIRE), Université de Lille, Sciences et Technologies, 59655 Villeneuve d’Ascq, France

2. Unité de Catalyse et Chimie du Solide (UCCS), Université de Lille, CNRS, Centrale Lille, Université d'Artois, UMR 8181 - UCCS, F-59000 Lille, France

Funder

Universit? de Lille

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.2c08723

Reference77 articles.

1. 30 years After the Chernobyl Nuclear Accident: Time for Reflection and Re-evaluation of Current Disaster Preparedness Plans

2. Radioactivity impacts of the Fukushima Nuclear Accident on the atmosphere

3. Materials and processes for the effective capture and immobilization of radioiodine: A review