Characterization of Microfabricated Probes for Combined Atomic Force and High-Resolution Scanning Electrochemical Microscopy
Author:
Affiliation:
1. Institute of Microtechnology, University of Neuchâtel, rue Jaquet-Droz 1, 2001 Neuchâtel, Switzerland
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac0521495
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