Quantitative Compositional Profiling of Conjugated Quantum Dots with Single Atomic Layer Depth Resolution via Time-of-Flight Medium-Energy Ion Scattering Spectroscopy

Author:

Jung Kang-Won1,Yu Hyunung2,Min Won Ja3,Yu Kyu-Sang3,Sortica M. A.4,Grande Pedro L.4,Moon DaeWon1

Affiliation:

1. Department of New Biology, DGIST, Dalseong, Daegu, 711-873, Republic of Korea

2. Division of Industrial Metrology, Korea Research Institute of Standards and Science, Daejeon 305-340, Republic of Korea

3. K-MAC, Yongsan-Dong 554, Yuseong-Gu, Daejeon 305-500, Republic of Korea

4. Instituto de Física, Universidade Federal do Rio Grande do Sul, Avenida Bento Gonçalves 9500, 91501-970 Porto Alegre, Rio Grande do Sul, Brazil

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

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