Multiple Transmission−Reflection Infrared Spectroscopy for High-Sensitivity Measurement of Molecular Monolayers on Silicon Surfaces-Reference-Cited by-同舟云学术

Multiple Transmission−Reflection Infrared Spectroscopy for High-Sensitivity Measurement of Molecular Monolayers on Silicon Surfaces

Published:2008-11-07 Issue:48 Volume:112 Page:12372-12377
ISSN:1089-5639
Container-title:The Journal of Physical Chemistry A
language:en
Short-container-title:J. Phys. Chem. A

Author:

Liu Hong-Bo¹,Venkataraman Nagaiyanallur V.¹,Bauert Tobias E.¹,Textor Marcus¹,Xiao Shou-Jun¹

Affiliation:

1. State Key Laboratory of Coordination Chemistry, School of Chemistry and Chemical Engineering, Nanjing National Laboratory of Microstructures, Nanjing University, Nanjing 210093, China, and Laboratory for Surface Science and Technology, Department of Materials, ETH Zurich, Wolfgang-Pauli-Strasse 10, CH-8093 Zurich, Switzerland

Publisher

American Chemical Society (ACS)

Subject

Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp804553x

Reference27 articles.

1. Infrared Study of Adsorbed Molecules on Metal Surfaces by Reflection Techniques

2. Reflection Method for Obtaining the Infrared Spectrum of a Thin Layer on a Metal Surface

3. Distortions of Band Shapes in External Reflection Infrared Spectra of Thin Polymer Films on Metal Substrates

4. Structure of Alkylsiloxane Monolayers on Silicon Surfaces Investigated by External Reflection Infrared Spectroscopy

5. Transmission Infrared Spectroscopy of Methyl- and Ethyl-Terminated Silicon(111) Surfaces

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