Combined Scanning Force Microscopy and Electrochemical Quartz Microbalance in-Situ Investigation of Specific Adsorption and Phase Change Processes at the Silver/Halogenide Interface-Reference-Cited by-同舟云学术

Combined Scanning Force Microscopy and Electrochemical Quartz Microbalance in-Situ Investigation of Specific Adsorption and Phase Change Processes at the Silver/Halogenide Interface

Published:1997-04-01 Issue:14 Volume:101 Page:2709-2715
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Kautek Wolfgang¹,Dieluweit Sabine¹,Sahre Mario¹

Affiliation:

1. Laboratory for Thin Film Technology, Federal Institute for Materials Research and Testing, D-12200 Berlin, Germany

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp962724w

Reference43 articles.

1. Surface-enhanced raman spectroscopy of electrochemically characterized interfaces

2. XPS Studies on Emersed Silver Electrodes: Coverage and Bonding State of Specifically Adsorbed Chloride

3. Electrochemical and In Situ Scanning Force Microscopy Investigation of Anion Effects on Ag(111) Electrode Surfaces

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