Gate Voltage Dependent Resistance of a Single Organic Semiconductor Grain Boundary
Author:
Affiliation:
1. Department of Chemical Engineering and Materials Science, University of Minnesota, 421 Washington Avenue SE, Minneapolis, Minnesota 55455
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/jp004519t
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1. Point contact current–voltage measurements on individual organic semiconductor grains by conducting probe atomic force microscopy
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5. Probing Electrical Transport in Nanomaterials: Conductivity of Individual Carbon Nanotubes
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