Subsurface Raman Imaging with Nanoscale Resolution-Reference-Cited by-同舟云学术

Subsurface Raman Imaging with Nanoscale Resolution

Published:2006-03-23 Issue:4 Volume:6 Page:744-749
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Anderson Neil¹,Anger Pascal¹,Hartschuh Achim¹,Novotny Lukas¹

Affiliation:

1. The Institute of Optics, University of Rochester, Rochester, New York 14627, and Institute of Physical and Theoretical Chemistry, University of Tuebingen, Tuebingen, Germany

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl0600023

Reference22 articles.

1. High spatial resolution subsurface thermal emission microscopy

2. Sykes, E. C. H.; Fernández-Torres, L. C.; Nanayakkara, S. U.; Mantooth, B. A.; Nevin, R. M.; Weiss, P. S.Proc. Natl. Acad. Sci.in press.

3. Nanoscale Imaging of Buried Structures via Scanning Near-Field Ultrasound Holography

4. Nanoscale-resolved subsurface imaging by scattering-type near-field optical microscopy

5. Two-photon optical-beam-induced current solid-immersion imaging of a silicon flip chip with a resolution of 325 nm

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