Surface Mass Spectrometry at the Submicrometer Scale-Reference-Cited by-同舟云学术

Surface Mass Spectrometry at the Submicrometer Scale

Published:2002-10-17 Issue:23 Volume:18 Page:8836-8840
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Verkhoturov S. V.¹,Schweikert E. A.¹,Rizkalla N. M.¹

Affiliation:

1. Center for Chemical Characterization, Texas A&M University, College Station, Texas 77843-3144, and Scientific Design Company, Inc., 49 Industrial Avenue, Little Ferry, New Jersey 07643

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la020437f

Reference15 articles.

1. Coincidence Counting in Time-of-Flight Mass Spectrometry: A Test for Chemical Microhomogeneity

2. Analysis of polystyrene/PVME blends by coincidence counting time-of-flight mass spectrometry

3. Pressure dependence of ethylene oxidation kinetics and the effects of added CO2 and Cs: A study on Ag(111) and Ag/α-Al2O3 catalysts

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