In Situ TEM Creation and Electrical Characterization of Nanowire Devices-Reference-Cited by-同舟云学术

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In Situ TEM Creation and Electrical Characterization of Nanowire Devices

Published:2012-05-14 Issue:6 Volume:12 Page:2965-2970
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Kallesøe Christian¹²,Wen Cheng-Yen³,Booth Timothy J.¹,Hansen Ole¹⁴,Bøggild Peter¹,Ross Frances M.⁵,Mølhave Kristian¹

Affiliation:

1. Department of Micro- and Nanotechnology, Technical University of Denmark, Kgs. Lyngby, Denmark

2. Centre for Microtechnology and Surface Analysis, Danish Technological Institute, Taastrup, Denmark

3. School of Materials Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana, United States

4. Center for Individual Nanoparticle Functionality (CINF), Technical University of Denmark, Kgs. Lyngby, Denmark

5. IBM T. J. Watson Research Center, Yorktown Heights, New York, United States

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl300704u

Reference35 articles.

1. Atomic-scale imaging of carbon nanofibre growth

2. Atomic-Scale In-situ Observation of Carbon Nanotube Growth from Solid State Iron Carbide Nanoparticles

3. Controlling nanowire structures through real time growth studies

4. VAPOR‐LIQUID‐SOLID MECHANISM OF SINGLE CRYSTAL GROWTH

5. Nanowire-based one-dimensional electronics

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2. Interface catalytic reduction of alumina by nickle for the aluminum nanowire growth: Dynamics observed by in situ TEM;Nano Research;2023-08-14

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5. In situ TEM modification of individual silicon nanowires and their charge transport mechanisms;Nanotechnology;2020-10-02

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