Highly Sensitive Elemental Analysis for Cd and Pb by Liquid Electrode Plasma Atomic Emission Spectrometry with Quartz Glass Chip and Sample Flow-Reference-Cited by-同舟云学术

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Highly Sensitive Elemental Analysis for Cd and Pb by Liquid Electrode Plasma Atomic Emission Spectrometry with Quartz Glass Chip and Sample Flow

Published:2011-11-22 Issue:24 Volume:83 Page:9424-9430
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Kitano Atsushi¹,Iiduka Akiko¹,Yamamoto Tamotsu²,Ukita Yoshiaki¹,Tamiya Eiichi³,Takamura Yuzuru¹

Affiliation:

1. School of Materials Science, Japan Advanced Institute of Science and Technology (JAIST), 1-1 Asahidai, Nomi, Ishikawa 923-1292, Japan

2. Micro Emission Ltd. Ishikawa Create Lab, 2-13 Asahidai, Nomi, Ishikawa 923-1211, Japan

3. Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka 565-0871, Japan

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac2020646

Reference60 articles.

1. Walsh, A.; Sullivan, J. V.Atomic Absorption Spectrophotometer. U.S. Patent 3,503,686, Mar 31, 1970.

2. High-pressure plasmas as spectroscopic emission sources

3. Inductively coupled argon plasma as an ion source for mass spectrometric determination of trace elements

4. The resonant gate transistor

5. A gas chromatographic air analyzer fabricated on a silicon wafer

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