Chemistry and Charge Trapping at the Interface of Silver and Ultrathin Layers of Zinc Oxide-Reference-Cited by-同舟云学术

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Chemistry and Charge Trapping at the Interface of Silver and Ultrathin Layers of Zinc Oxide

Published:2021-10-09 Issue:41 Volume:13 Page:49423-49432
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Rahamim M.¹,Cohen H.²,Edri E.¹³⁴^ORCID

Affiliation:

1. Department of Chemical Engineering, Ben-Gurion University of the Negev, Be’er-Sheva 8410501, Israel

2. Department of Chemical Research Support, Weizmann Institute of Science, Rehovot 7610000, Israel

3. Ilse Katz Institute for Nanoscale Science and Technology, Be’er-Sheva 8410501, Israel

4. Blechner Center for Industrial Catalysis and Process Development, Be’er-Sheva 8410501, Israel

Funder

Ministry of National Infrastructure, Energy and Water Resources

Ben-Gurion University of the Negev

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/acsami.1c11566

Reference73 articles.

1. Emerging applications using metal-oxide semiconductor thin-film devices

2. Review on charge transfer and chemical activity of TiO 2 : Mechanism and applications

3. Retracted Article: Recent advances of metal–metal oxide nanocomposites and their tailored nanostructures in numerous catalytic applications

4. Transition metal oxides as the buffer layer for polymer photovoltaic cells

5. ZnO Schottky barriers and Ohmic contacts

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