Dual-Frequency Electrowetting: Application to Drop Evaporation Gauging within a Digital Microsystem-Reference-Cited by-同舟云学术

Dual-Frequency Electrowetting: Application to Drop Evaporation Gauging within a Digital Microsystem

Published:2011-11-29 Issue:1 Volume:28 Page:1041-1048
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Theisen Johannes¹,Davoust Laurent²

Affiliation:

1. Microfluidics Group, Laboratory of Geophysical and Industrial Fluid Flows (LEGI), University of Grenoble, 38041 Grenoble, France

2. Electromagnetic Processing of Materials (EPM) Group, Materials and Processes Science and Engineering Laboratory (SIMaP), Grenoble Institute of Technology (Grenoble INP), 38402 Saint Martin d’Hères, France

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la203645t

Reference31 articles.

1. Electrowetting: a recent outbreak

2. Capillary Spreading Dynamics of Electrowetted Sessile Droplets in Air

3. Electrowetting with contact line pinning: Computational modeling and comparisons with experiments

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