High-Resolution TOF-SIMS Study of Varying Chain Length Self-Assembled Monolayer Surfaces
Author:
Affiliation:
1. Department of Chemistry, Princeton University, Princeton, New Jersey 08544, and Evans East, East Windsor, New Jersey 08520
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac020275s
Reference33 articles.
1. Capabilities of static TOF-SIMS in the differentiation of first-row transition metal oxides
2. Imaging Time-of-Flight Secondary Ion Mass Spectrometry Allows Visualization and Analysis of Coexisting Phases in Langmuir−Blodgett Films
3. Secondary ion yields produced by keV atomic and polyatomic ion impacts on a self-assembled monolayer surface
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