Cryogenic Focused Ion Beam Enables Atomic-Resolution Imaging of Local Structures in Highly Sensitive Bulk Crystals and Devices-Reference-Cited by-全球学者库

Cryogenic Focused Ion Beam Enables Atomic-Resolution Imaging of Local Structures in Highly Sensitive Bulk Crystals and Devices

Published:2022-02-14 Issue:7 Volume:144 Page:3182-3191
ISSN:0002-7863
Container-title:Journal of the American Chemical Society
language:en
Short-container-title:J. Am. Chem. Soc.

Author:

Zhou Jinfei¹,Wei Nini¹,Zhang Daliang¹,Wang Yujiao¹,Li Jingwei¹,Zheng Xiaopeng²^ORCID,Wang Jianjian¹^ORCID,Alsalloum Abdullah Y.²^ORCID,Liu Lingmei¹^ORCID,Bakr Osman M.²^ORCID,Han Yu³^ORCID

Affiliation:

1. Multi-scale Porous Materials Center, Institute of Advanced Interdisciplinary Studies & School of Chemistry and Chemical Engineering, Chongqing University, Chongqing 400044, P. R. China

2. Physical Sciences and Engineering Division, KAUST Catalysis Center (KCC), King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia

3. Physical Sciences and Engineering Division, Advanced Membranes and Porous Materials (AMPM) Center, King Abdullah University of Science and Technology (KAUST), Thuwal 23955-6900, Saudi Arabia

Funder

Ministry of Education of the People's Republic of China

China National Funds for Distinguished Young Scientists

King Abdullah University of Science and Technology

Publisher

American Chemical Society (ACS)

Subject

Colloid and Surface Chemistry,Biochemistry,General Chemistry,Catalysis

Link

https://pubs.acs.org/doi/pdf/10.1021/jacs.1c12794

Reference50 articles.

1. The Theoretical Resolution Limit of the Electron Microscope