Rotational Spectroscopic and ab Initio Studies of the Xe−H2O van der Waals Dimer
Author:
Affiliation:
1. Department of Chemistry, University of Alberta, Edmonton AB T6G 2G2, Canada
Publisher
American Chemical Society (ACS)
Subject
Physical and Theoretical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/jp0619890
Reference56 articles.
1. Enhancement of Solution NMR and MRI with Laser-Polarized Xenon
2. Nuclear Magnetic Resonance of Laser-Polarized Noble Gases in Molecules, Materials, and Organisms
3. Spin polarization-induced nuclear Overhauser effect: An application of spin-polarized xenon and helium
4. Nuclear Magnetic Resonance of Physisorbed129Xe Used as a Probe to Investigate Porous Solids
5. The Xe shielding surfaces for Xe interacting with linear molecules and spherical tops
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