Atomic Force Microscope Controlled Topographical Imaging and Proximal Probe Thermal Desorption/Ionization Mass Spectrometry Imaging-Reference-Cited by-同舟云学术

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Atomic Force Microscope Controlled Topographical Imaging and Proximal Probe Thermal Desorption/Ionization Mass Spectrometry Imaging

Published:2013-12-30 Issue:2 Volume:86 Page:1083-1090
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Ovchinnikova Olga S.¹,Kjoller Kevin²,Hurst Gregory B.¹,Pelletier Dale A.³,Van Berkel Gary J.¹

Affiliation:

1. Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131

2. Anasys Instruments, Santa Barbara, California 93101

3. Biological and Nanoscale Systems Group, Biosciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6036

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac4026576

Reference47 articles.

1. Advances in atomic force microscopy

2. The new future of scanning probe microscopy: Combining atomic force microscopy with other surface-sensitive techniques, optical microscopy and fluorescence techniques

3. Invited Review Article: Combining scanning probe microscopy with optical spectroscopy for applications in biology and materials science

4. Imaging mass spectrometry

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