Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy-Reference-Cited by-同舟云学术

Correlative Analysis of Ion-Concentration Profile and Surface Nanoscale Topography Changes Using Operando Scanning Ion Conductance Microscopy

Author:

Takahashi Yasufumi¹²^ORCID,Takamatsu Daiko³,Korchev Yuri²⁴,Fukuma Takeshi²⁵^ORCID

Affiliation:

1. Department of Electronics, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan

2. WPI Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Kanazawa 920-1192, Japan

3. Center for Exploratory Research, Research & Development Group, Hitachi, Ltd., Hatoyama-machi, Saitama 350-0395, Japan

4. Department of Medicine, Imperial College London, London W12 0NN, United Kingdom

5. Division of Electrical Engineering and Computer Science, Kanazawa University, Kakuma-machi, Kanazawa 920-1192, Japan

Funder

Toyota Foundation

Murata Science Foundation

Hokuriku Electric Power Company

Asahi Glass Foundation

Japan Society for the Promotion of Science

Publisher

American Chemical Society (ACS)

Subject

General Medicine

Link

Reference67 articles.

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献