Methodology for Quantitative Measurements of Multilayer Polymer Thin Films with IR Spectroscopic Ellipsometry
Author:
Affiliation:
1. Polymers Division, National Institute of Standards and Technology, 100 Bureau Dr, Gaithersburg, Maryland 20899
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Inorganic Chemistry,Polymers and Plastics,Organic Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ma900707p
Reference20 articles.
1. Characterization of Si nanocrystals into SiO2 matrix
2. Recombination Behaviour at the Ultrathin Polypyrrole Film/Silicon Interface Investigated byIn-situPulsed Photoluminescence
3. Ultrathin polypyrrole films on silicon substrates
4. Study of the interface Si-nc/SiO2 by infrared spectroscopic ellipsometry and X-ray photoelectron spectroscopy
5. Infrared Spectroscopic Ellipsometry of n-Alkylthiol (C5-C18) Self-Assembled Monolayers on Gold
Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Process Instrumentation;Plastics Process Analysis, Instrumentation, and Control;2021-03-05
2. Structure and Interactions of Polymer Thin Films from Infrared Ellipsometry;Ellipsometry of Functional Organic Surfaces and Films;2018
3. Extracting interface locations in multilayer polymer waveguide films using scanning angle Raman spectroscopy;Journal of Raman Spectroscopy;2017-11-09
4. Interactions at the Peptide/Silicon Surfaces: Evidence of Peptide Multilayer Assembly;Langmuir;2016-07-07
5. Characterization of Polymer Blends: Ellipsometry;Characterization of Polymer Blends;2014-10-31
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3