Crystal Structure of La4Si2O7N2 Analyzed by the Rietveld Method Using the Time-of-Flight Neutron Powder Diffraction Data-Reference-Cited by-同舟云学术

Crystal Structure of La4Si2O7N2 Analyzed by the Rietveld Method Using the Time-of-Flight Neutron Powder Diffraction Data

Published:2003-02-11 Issue:5 Volume:15 Page:1099-1104
ISSN:0897-4756
Container-title:Chemistry of Materials
language:en
Short-container-title:Chem. Mater.

Author:

Takahashi Junichi¹,Yamane Hisanori¹,Hirosaki Naoto¹,Yamamoto Yoshinobu¹,Suehiro Takayuki¹,Kamiyama Takashi¹,Shimada Masahiko¹

Affiliation:

1. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan, National Institute for Materials Science, Tsukuba 305-0044, Japan, and High Energy Accelerator Research Organizations, Tsukuba 305-0801, Japan

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/cm020930c

Reference33 articles.

1. The silicon lanthanide oxynitrides

2. Phase relationships in the system Si3N4-Y2O3-SiO2

3. Silicon lanthanide oxynitrides of the M4Si2O7N2 type

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