Scanning Probe Microscopy
Author:
Affiliation:
1. The George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0405
Publisher
American Chemical Society (ACS)
Subject
Analytical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/ac0400818
Reference247 articles.
1. Self-oscillating tapping mode atomic force microscopy
2. Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation
3. Tapping mode atomic force microscopy in liquid with an insulated piezoelectric microactuator
4. Integrated piezoresistive sensors for atomic force-guided scanning Hall probe microscopy
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