Infrared Spectroscopic Ellipsometry of Self-Assembled Monolayers-Reference-Cited by-同舟云学术

Infrared Spectroscopic Ellipsometry of Self-Assembled Monolayers

Published:2000-10-31 Issue:24 Volume:16 Page:9483-9487
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Meuse Curtis W.¹

Affiliation:

1. Biotechnology Division, Chemical Science and Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8313

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la000146b

Reference22 articles.

1. Spectroscopic ellipsometry in the infrared

2. Improvement in accuracy of spectroscopic IR ellipsometry by the use of IR retarders

3. IR spectroscopic ellipsometry: instrumentation and results

4. Spectroscopic ellipsometry of ultrathin films: From UV to IR

5. Phase‐modulated ellipsometer using a Fourier transform infrared spectrometer for real time applications

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