Time-of-Flight Secondary Ion Mass Spectrometric Analysis of Polymer Tertiary Structure in Langmuir Monolayer Films of Poly(dimethylsiloxane)-Reference-Cited by-同舟云学术

Time-of-Flight Secondary Ion Mass Spectrometric Analysis of Polymer Tertiary Structure in Langmuir Monolayer Films of Poly(dimethylsiloxane)

Published:2007-04-28 Issue:11 Volume:79 Page:4126-4134
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Piwowar Alan M.¹,Gardella Joseph A.¹

Affiliation:

1. Department of Chemistry, State University of New York at Buffalo, Buffalo, New York 14260

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac070056c

Reference23 articles.

1. Interchain Ion Formation in Secondary Ion Mass Spectrometry Resulting from the Double-Helical Structure of Isotactic Poly(methyl methacrylate) in Adsorbed Monolayers

2. SIMS studies of polymeric tertiary structures in monolayers: Polysiloxane helical coil structures

3. Yan, W.Y.; Gardella, J. A., Jr.Time of Flight Secondary Ion MassSpectrometry Study of Ion Formation Mechanisms: Effects of End GroupChemistry; John Wiley and Sons: New York, 1998; Vol. XI, pp 451−454.

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