Experimental Investigation of Charge Carrier Transport in Organic Thin-Film Transistors with “Buried Surface Layers”-Reference-Cited by-同舟云学术

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Experimental Investigation of Charge Carrier Transport in Organic Thin-Film Transistors with “Buried Surface Layers”

Published:2011-01-27 Issue:2 Volume:3 Page:139-142
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Wei Qingshuo¹,Hashimoto Kazuhito¹²,Tajima Keisuke¹²

Affiliation:

1. HASHIMOTO Light Energy Conversion Project, Exploratory Research for Advanced Technology (ERATO), Japan Science Technology Agency (JST)

2. Department of Applied Chemistry, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/am101135v

Reference20 articles.

1. Structural Characterization of a Pentacene Monolayer on an Amorphous SiO2 Substrate with Grazing Incidence X-ray Diffraction

2. Highly oriented crystals at the buried interface in polythiophene thin-film transistors

3. Control of the Interchain π−π Interaction and Electron Density Distribution at the Surface of Conjugated Poly(3-hexylthiophene) Thin Films

4. Solvent Effects on Chain Orientation and Interchain π-Interaction in Conjugated Polymer Thin Films: Direct Measurements of the Air and Substrate Interfaces by Near-Edge X-ray Absorption Spectroscopy

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