Role of Tip Chemical Reactivity on Atom Manipulation Process in Dynamic Force Microscopy-Reference-Cited by-同舟云学术

Role of Tip Chemical Reactivity on Atom Manipulation Process in Dynamic Force Microscopy

Published:2013-08-01 Issue:8 Volume:7 Page:7370-7376
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Sugimoto Yoshiaki¹,Yurtsever Ayhan¹²,Abe Masayuki¹³,Morita Seizo¹²,Ondráček Martin⁴,Pou Pablo⁵,Pérez Ruben⁵,Jelínek Pavel⁴

Affiliation:

1. Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, Osaka 565-0871, Japan

2. Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan

3. Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan

4. Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnická 10/112, Prague, 162 00, Czech Republic

5. Departamento de Física Teórica de la Materia Condensada and Condensed Matter Physics Center (IFIMAC), Universidad Autónoma de Madrid, E-28049 Madrid, Spain

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/nn403097p

Reference31 articles.

1. Noncontact Atomic Force Microscopy

2. Advances in atomic force microscopy

3. Quantitative Measurement of Short-Range Chemical Bonding Forces

4. Chemical identification of individual surface atoms by atomic force microscopy

5. Chemical Identification of Single Atoms in Heterogeneous III–IV Chains on Si(100) Surface by Means of nc-AFM and DFT Calculations

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