Degradation of Organic Electroluminescent Devices. Evidence for the Occurrence of Spherulitic Crystallization in the Hole Transport Layer
Author:
Affiliation:
1. Xerox Research Centre of Canada, 2660 Speakman Drive, Mississauga, Ontario, Canada L5K 2L1
2. Department of Mechanical and Industrial Engineering, University of Toronto, 5 King's College Road, Toronto, Ontario, Canada M5S 3G8
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/la9709406
Reference9 articles.
1. Organic electroluminescent diodes
2. Reliability and degradation of organic light emitting devices
3. Formation and growth of black spots in organic light‐emitting diodes
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