Intermediate-Temperature Ceramic Fuel Cells with Thin Film Yttrium-Doped Barium Zirconate Electrolytes-Reference-Cited by-同舟云学术

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Intermediate-Temperature Ceramic Fuel Cells with Thin Film Yttrium-Doped Barium Zirconate Electrolytes

Published:2009-06-17 Issue:14 Volume:21 Page:3290-3296
ISSN:0897-4756
Container-title:Chemistry of Materials
language:en
Short-container-title:Chem. Mater.

Author:

Shim Joon Hyung¹,Park Joong Sun¹,An Jihwan¹,Gür Turgut M.²,Kang Sangkyun³,Prinz Fritz B.¹²

Affiliation:

1. Department of Mechanical Engineering, Stanford University, Stanford, California 94305

2. Department of Material Science and Engineering, Stanford University, Stanford, California 94305

3. Samsung Advanced Institute of Technology, Samsung Electronics, Giheung, Gyeonggi-do, Korea

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/cm900820p

Reference41 articles.

1. Proton Conduction in Sintered Oxides Based on BaCeO3

2. Systematic examination of hydrogen ion conduction in rare-earth doped barium cerate ceramics

3. A quantum molecular dynamics study of the cubic phase of BaTiO3 and BaZrO3

4. Proton-Conducting Oxides

5. Proton Transport and Microstructure Properties in Superlattice Thin Films Fabricated by Pulsed Laser Deposition

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1. Atomic and Molecular Layer Deposition of Functional Thin Films Based on Rare Earth Elements;Advanced Materials Interfaces;2024-08-23

2. Challenges and Advancements in the Electrochemical Utilization of Ammonia Using Solid Oxide Fuel Cells;Advanced Materials;2024-06-23

3. Syngas Production from CO₂ and H₂O via Solid-Oxide Electrolyzer Cells: Fundamentals, Materials, Degradation, Operating Conditions, and Applications;Chemical Reviews;2024-04-15

4. Interface Engineering to Operate Reversible Protonic Ceramic Electrochemical Cells Below 500 °C;Advanced Energy Materials;2024-04-10

5. The Formation of Stacking Faults in Barium Zirconate-Type Perovskites;Chemistry of Materials;2023-08-04

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