Lateral and Vertical Quantification of Spin-Coated Polymer Films on Silicon by TOF-SIMS, XPS, and AFM-Reference-Cited by-同舟云学术

Lateral and Vertical Quantification of Spin-Coated Polymer Films on Silicon by TOF-SIMS, XPS, and AFM

Published:2002-11-26 Issue:51 Volume:106 Page:13114-13121
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Norrman K.¹,Haugshøj K. B.¹,Larsen N. B.¹

Affiliation:

1. The Danish Polymer Centre, Risø National Laboratory, DK-4000 Roskilde, Denmark, and Centre for Surface Analysis, Danish Technological Institute, DK-2630 Taastrup, Denmark

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp020069o

Reference14 articles.

1. Surface Analysis of Polymers by XPS and Static SIMS

2. Surface characterization of EVA copolymers and blends using XPS and ToF-SIMS

3. Surface Characterization of EMA Copolymers Using XPS and ToF-SIMS

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