Using Accelerated Life Tests Results to Predict Product Field Reliability-Reference-Cited by-同舟云学术

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Using Accelerated Life Tests Results to Predict Product Field Reliability

Published:2009-05 Issue:2 Volume:51 Page:146-161
ISSN:0040-1706
Container-title:Technometrics
language:en
Short-container-title:Technometrics

Author:

Meeker William Q.,Escobar Luis A.,Hong Yili

Publisher

Informa UK Limited

Subject

Applied Mathematics,Modeling and Simulation,Statistics and Probability

Link

http://www.tandfonline.com/doi/pdf/10.1198/TECH.2009.0016

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