Stress measurement in East Asian lacquer thin films owing to changes in relative humidity using phase-shifting interferometry
Author:
Affiliation:
1. Wolfson School of Mechanical and Manufacturing Engineering, Loughborough University, Loughborough LE11 3TU, UK
2. Victoria and Albert Museum, London SW7 2RL, UK
Abstract
Publisher
The Royal Society
Subject
General Physics and Astronomy,General Engineering,General Mathematics
Link
https://royalsocietypublishing.org/doi/pdf/10.1098/rspa.2010.0414
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2. Effects of H-implantation energy on the optical stability of implanted urushi films under photo-irradiation
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4. Residual Stresses in Thermal Spray Coatings and Their Effect on Interfacial Adhesion: A Review of Recent Work
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