The analysis of surface layers by electron diffraction

Author:

Abstract

The very close correspondence which has been shown to exist between the diffraction patterns formed by cathode rays passing through thin solid films,* and the crystal structure of these films, suggests the possibility of using electron diffraction to investigate surface layers of unknown composition. This possibility was indeed indicated in Davisson and Germer’s original paper and has since been further applied. These experiments have all been made with slow electrons, of energies of the order of 300 volts. With such electrons the experiments do not agree well with theory even in the case of known structures, so their application to the investigation of unknown structures involves considerable uncertainty. Further, slow electrons can only be detected photographically with very long exposures, while the electric method of detection is very cumbrous if it is desired to survey the complete diffraction pattern. For these reasons I decided to use the apparatus described in the previous paper to investigate the diffraction patterns obtained by the reflection of cathode rays from the surfaces of various solids. The discharge was generally produced by an induction coil and the energy of the rays was of the order of 30,000 volts. In a few cases, an Evershed and Vignolles direct-current generator was used giving about 6,000 volts. In the course of the investigations, it appeared that these fast rays are uninfluenced by the thin layers of gas which are normally present on surfaces in a vacuum, or, possibly, that they temporally remove the layers by bombardment. From one point of view this is an advantage, as it is therefore unnecessary to take special precautions to degas the surfaces used, or to keep a very high vacuum. On the other hand, it limits the range of the method to the investigation of solid layers.

Publisher

The Royal Society

Subject

General Medicine

Cited by 44 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3