A kinematical theory of diffraction contrast of electron transmission microscope images of dislocations and other defects

Author:

Abstract

This paper describes a kinematical theory of electron microscope images of dislocations observed by transmission in thin crystalline foils. The contrast is essentially phase contrast in the Bragg diffracted beams, the phase differences being due to the displacements of the atoms from their positions in the ideally perfect crystal. The theory explains many of the characteristic features of the observed images, such as the dependence of the contrast on orientation, the reversal of contrast on bright and dark field images, the fact that dislocations are generally dark on bright field images, the position and width of the images, the general nature of the profile, the occurrence of dotted dislocations, the invisibility of some dislocations, the dependence of contrast on the inclination of the dislocation, and the occurrence of double images. The theory also accounts satisfactorily for the nature and width of the dislocation images obtained with X-rays.

Publisher

The Royal Society

Subject

General Engineering

Reference17 articles.

1. Bassett G. A. M enter J . W. & Pashley D. W . 1958 Proc. Roy. Soc. A 2 4 6 345.

2. Interference Effects in the Electron Microscopy of Thin Crystal Foils

3. Bollm ann W . 1957 Proceedings o f the Stockholm Conference on Electron p. 316. Stockholm : Alm qvist and Wiksell.

4. Zur r�ntgenographischen Bestimmung des Typs einzelner Versetzungen in Einkristallen

5. Bonse U . & K appler E. 1958 Z. Naturf. 13 a 348.

Cited by 444 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3