The geometrical aberrations of general electron optical systems II. The primary (third order) aberrations of orthogonal systems, and the secondary (fifth order) aberrations of round systems

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Abstract

The theory of characteristic functions, developed by Sturrock for electron optics, is used to calculate the primary aberrations of rectilinear orthogonal systems of the most general kind. In the second part, the secondary aberrations of round systems are calculated with the aid of Sturrock’s second-order perturbation characteristic functions. A proof of the equivalence of the aberration formulae obtained by Melkich, using the variation of parameters method, and those obtained below is offered in an appendix.

Publisher

The Royal Society

Subject

General Engineering

Reference4 articles.

1. Elektronen- und Ionenoptik;Glaser W.;Handb.,1956

2. Hawkes P. W. 1963 The aberrations of electron optical systems in the absence of rotational symmetry. Thesis Cambridge 440 + XXIX pp.

3. Hawkes P. W. 1965 conditions imposed by symmetry.

4. Hawkes P. W. 1965 a The geometrical aberrations of general electron optical systems. I. The

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