Abstract
A scanning X-ray interferometer was used to measure the forward scattering amplitude for zirconium at a number of wavelengths near the K absorption edge. The precision of previous experiments has usually been limited by lack of knowledge of either the sample density or its shape. These problems have been eliminated by making simultaneous measurements at two X-ray wavelengths. This new measurement algorithm can be applied at any wavelength which is accessible to X-ray interferometers. The X-ray optical constants of elements with Z ≥ 10 can be determined over the range 0.1 Å<A< 5Å to a precision which is sufficient to rekindle theoretical interest in the subject.
Reference25 articles.
1. The Refraction of the CopperK-Series by Quartz
2. Bonse U. & Hart M. 1965
3. Bonse U. & Hellkotter H . 1969
4. Z;Bonse U.;Phys.,1972
5. Appl.Phys. Lett. 6 155. Z.Phys. 223 345.
Cited by
32 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献