Abstract
From an experimental investigation of superfluid film transfer in narrow beakers in helium II it emerges that there are probably two kinds of film. A ‘normal’ film is formed by superfluid creep over a dry substrate. A ‘thick’ film remains when liquid has drained from a substrate that has previously been immersed in the liquid helium bath. A comparison has been made of the superfluid flow between the two types of film. Scatter of values of transfer rate associated with a normal film is attributed to third sound generated by bath waves impinging on the meniscus at the base of the film. The thick film shows an enhanced rate of transfer which can persist for long periods of time in quiet conditions, but which can be abruptly diminished by disturbances such as bath surface agitation. There is a maximum stable length for a thick film exhibiting the full enhanced rate. The enhanced rate can be as much as 60% greater than the normal rate at 1° K, but the difference between the two rates of transfer disappears above 1.8 °K. No enhanced rate of transfer at any temperature is observed in beakers as large as 8 mm diameter.
Reference17 articles.
1. Allen J . F . i960 Nature Lond. 185 831.
2. Allen J . F . 1963 Proc. Enrico Ferm i In t. School Phys. Varenna p. 305. London: Academic Press.
3. Third and Fourth Sound in Liquid Helium II
4. Proc. P hys;Bowers R .;Soc. A,1950
5. a Proc. Roy;Mendelssohn K .;Soc. A,1939
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. John Frank Allen. 6 May 1908—22 April 2001;Biographical Memoirs of Fellows of the Royal Society;2023-09-13
2. Case study of a 4He evaporation refrigerator for polarized target experiments;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2020-10
3. Superfluid helium-4 film flow at 11 mK to 1.6 K;Journal of Low Temperature Physics;1983-08
4. Flow-rate transitions in the helium-II film;Journal of Low Temperature Physics;1971-05
5. Dependence of the Helium-Film Transfer Rate on Pressure Head, Film Height, and Substrate;Physical Review A;1971-01-01