Abstract
A transmission electron microscopy study has been made of the monoclinic to tetragonal phase transformation in thin films of zirconia. The films were prepared by the oxidation and subsequent recrystallization of zirconium foils. The transformation, which is rapid and reversible, is generally accompanied by twinning on (100) and {110} planes. The orientation relations between the two phases and the shape change accompanying transformation have been determined. The twinning shears have also been measured. Stacking faults on several low index planes have been observed in monoclinic zirconia and dislocations are present in both phases. Cracks occur in the films on transformation from the tetragonal to the monoclinic phase.
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