X–ray topographic study of striation formation in layer growth of crystals from solutions-Reference-Cited by-同舟云学术

X–ray topographic study of striation formation in layer growth of crystals from solutions

Published:1999-10 Issue:1761 Volume:357 Page:2631-2649
ISSN:1364-503X
Container-title:Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences
language:en
Short-container-title:Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences

Author:

Smolsky I. L.¹,Voloshin A. E.¹,Zaitseva N. P.²,Rudneva E. B.¹,Klapper H.³

Affiliation:

1. Shubnikov Institute of Crystallography, Russian Academy of Sciences, 59 Leninskii Prospect, Moscow 117333, Russia

2. Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, CA 94551, USA

3. Mineralogisch–Petrologisches Institut und Museum der Universität Bonn, Poppelsdorfer Schloss, 53115 Bonn, Germany

Publisher

The Royal Society

Subject

General Physics and Astronomy,General Engineering,General Mathematics

Link

Reference25 articles.

1. Highly effective parametric transformation of light frequency in wide-aperture rapidly grown crystals;Akhmanov S. A.;Kvantovaya Elektronica,1984

3. Chernov A. A. 1984 Modern crystallography (ed. B. K. Vainstein A. A. Chernov & L. A. Shuvalov) 1st edn vol. 3 ch. 1 pp. 7-232. Springer.

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