Abstract
For structures with helical symmetry one electron micrographic image of the structure can provide sufficient information to reconstruct a three-dimensional image provided that, to the resolution to which one is working, only one helical family contributes to each layer plane of the Fourier transform of the structure (DeRosier & Klug 1968; DeRosier & Moore 1970).
Subject
Industrial and Manufacturing Engineering,General Agricultural and Biological Sciences,General Business, Management and Accounting,Materials Science (miscellaneous),Business and International Management
Cited by
8 articles.
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